March 9, 2015

NIST Gets New Angle on X-Ray Measurements

(March 9, 2015)  Criminal justice, cosmology and computer manufacturing may not look to have much in common, but these and many other disparate fields all depend on sensitive measurements of X-rays. Scientists at the National Institute of Standards and Technology (NIST) have developed a new method* to reduce uncertainty in X-ray wavelength measurement that could provide improvements awaited for decades.