April 22, 2013

University of Illinois researchers measure near-field behavior of semiconductor plasmonic microparticles




Nanometer-scale heating reveals surface plasmon resonance

Recent progress in the engineering of plasmonic structures has enabled new kinds of nanometer-scale optoelectronic devices as well as high-resolution optical sensing. But until now, there has been a lack of tools for measuring nanometer-scale behavior in plasmonic structures which are needed to understand device performance and to confirm theoretical models.

“For the first time, we have measured nanometer-scale infrared absorption in semiconductor plasmonic microparticles using a technique that combines atomic force microscopy with infrared spectroscopy,” explained William P. King, an Abel Bliss Professor in the Department of Mechanical Science and Engineering (MechSE) at Illinois. “Atomic force microscope infrared spectroscopy allows us to directly observe the plasmonic behavior within microparticle infrared antennas.”